Final report and presentation of my internship at CEA-Grenoble¹/INAC/SP2M/NRS and ESRF²/BM32

(3nd/last year internship of engineering school at ENSM-SE³) from 03/2010 to 09/2010

on the Installation and Test Runs of the UHV-CVD System on BM32 (ESRF) / Study of the Dislocation Network at Si/Si Interface Formed by Wafer Bonding Method using Synchrotron X-ray Diffraction

The project was supervised by Gilles Renaud^1,2, and Karim Inal³

Both the report and the presentation received 20/20

rapport_3A_Tao_ZHOU

oral_3A_Tao_ZHOU

Final report and presentation of my internship at CEA-Grenoble¹/INAC/SP2M/NRS and ESRF²/BM32

(2nd year internship of engineering school at ENSM-SE³) from 05/2009 to 09/2009

on the Study of the (2×N) surface reconstruction of the Ge/Si(001) wetting layer using grazing incidence synchrotron x-ray diffraction

The project was supervised by Gilles Renaud^1,2, Christine Revenant¹, Tobias Schulli² and Karim Inal³

Both the report and the presentation received 20/20

rapport_2A_Tao_ZHOU

oral_2A_Tao_ZHOU

^{1 Commissariat à l’Energie Atomique et aux Energies Alternatives de Grenoble
2 Europeen Synchrotron Radiation Facility
3 Ecoles National Supérieur des Mines de Saint Etienne}